Zeiss Releases New FIB for Automated TEM Prep
Germany based Zeiss has released a new version of its Crossbeam 550 dual-beam FIB called the Samplefab. Zeiss claims the system can...
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The latest news concerning electron microscopes and their related industries and disciplines.
Electron Microscopy News
Oct 28
Thermo Fisher Releases New STEM with Integrated EELS
Massachusetts based Thermo Fisher Scientific (TFS) has released a new Scanning Transmission Electron Microscope (STEM) called the Iliad....
Oct 28
GATAN Releases New EDAX Octane Elite Ultra EDS Detector
EDAX, a product of Gatan which in turn is owned by Ametek has released the new windowless EDS detector with a large 160mm2 sensor called...
Oct 14
Craic Releases Apollo M Confocal Raman Microscope
Craic Technologies has released the Apollo M, a confocal Raman microscope. Craic claims the system will provide: High resolution optical...
Sep 2
Thermo Fisher Releases New Schottky FE-SEM
Thermo Fisher has just released the new Apreo ChemiSEM Schottky SEM. This new system is an expansion of the original ChemiSEM, which is a...
Sep 2
IXRF Releases Vertias Macro XRF
IXRF has released a new macro XRF instrument called the Veritas. IXRF claims this instrument is ideal for large-scale elemental analysis,...
Sep 2
Hitachi Releases New Tabletop SEM
Hitachi has released a new version of its popular TM4000 series of tabletop SEM's. The new instruments are called the TM4000III and...
Aug 10
JEOL Releases New UHR FE-SEM, JSM-IT810
JEOL has released a new version of their Ultra High Resolution Schottky Field Emission Scanning Electron Microscope, the JSM-IT810....
Aug 10
DENS Solutions Releases 8-Contact Environmental TEM Holder
The new DENS Solutions Infinity solution is a TEM/STEM holder capable of in-situ heating, biasing, gas or liquid experiments (some of...
Aug 10
CRAIC Introduces FilmPro 2 Software for Thin Film Thickness Measurement
CRAIC's new FilmPro 2 is a software platform for use with CRAIC spectrometers, allowing for thin film thickness measurements. CRAIC...
May 30
JEOL Releases New Compact 120keV TEM
It's not a washing machine, but a new compact 120keV TEM from JEOL. The JEM-120i is a compact TEM designed to fit into very small spaces....
May 29
Oxford Releases Two New Benchtop Confocal Microscopes
Oxford Instruments Andor has released two new models of benchtop confolcal microscopes to add to its existing BC43 CF model, which first...
May 29
Oxford Makes Offline AFM Analysis Software Available for Jupiter XR
Oxford Instruments Asylum Research has released the new AR Maps software package for the Jupiter XR atomic force microscope (AFM). AR...
May 29
Hitachi Announces Two New Schottky VP-SEM's
Hitachi High Tech has announced two new Schottky-sourced VP-SEM's. The SU3800SE and SU3900SE are Schottky versions of their...
May 29
Evident (Olympus) Announces Software Integration for Light Microscopes
Evident's PRECiV image analysis software has been integrated with their entire line of DSX1000 digital microscopes. Evident claims this...
Apr 20
CRAIC Releases SampleSafe™ Technology for OLM Spectroscopy Applications
CRAIC Technologies ahs released SampleSafe™ technology which protects samples from the effects of UV exposure and photobleaching which...
Mar 30
Allied High Tech Releases New Grinders/Polishers
Allied High Tech has released the MetPrep 3x and MetPrep 4x grinders/polishers to the market. These are polishing (or grinding) wheels...
Mar 24
JEOL Releases New Cryo FIB-SEM
Japan based JEOL has announced the new IB-Z200021CFS and IB-Z200022CPC cryo capable FIB-SEM's. The systems are designed to prepare frozen...
Mar 24
Emsis releases new 5 megapixel MAKIYA TEM Camera
German based company Emsis has announced its newest TEM camera, the MAKIYA. The CMOS camera can collect images up to 2,464 x 2056 pixels...
Mar 24
Cameca Releases NanoSIMS-HR
Cameca has announced the new NanoSIM-HR Secondary Ion Mass Spectrometer. Cameca claims the new system is capable of <30nm lateral...
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