JEOL has released the new JEM-Z200MF MARS, an atomic resolution STEM/TEM. The new system boasts the new MARS system, which stands for Magnetic field-free Atomic Resolution imaging System. JEOL claims this new system allows for ultra high resolution imaging while keeping the sample out of strong magnetic fields. This would be ideal in certain materials research fields, especially where magnets, semiconductor devices, or other ferromagnetic samples require research.
